Post by TOPTICA Photonics

🐣 Chicken-and-egg problem of ultra-low-noise RF development solved by TOPTICA’s photonic microwave solution If you develop something quieter than anything else, what do you measure it against? You need a benchmark significantly better than the device under test, ideally traceable to national metrology institutes. This challenge can be addressed with TOPTICA’s new X-band metrological microwave solution (X-MMS). The X-MMS is an ultra-pure local oscillator enabling fast, accurate RF measurements across applications ranging from advanced oscillators to very-long-baseline interferometry. It delivers: Industry-leading phase noise: –102 dBc/Hz at 1 Hz offset; noise floor of –166 dBc/Hz beyond 10 kHz 👉 Unrivalled noise performance between 1 Hz and 1 kHz (to the best of our knowledge neither commercially nor in research) 👉 Exceptionally clean spectrum, because your noise is only as good as your worst spur 👉 Fractional frequency stability of 2×10⁻¹⁶ at 1 second, optionally further locked to your RF reference or directly to the SI second 👉 Based on commercial off-the-shelf components Using three-system cross-correlation, we reveal noise levels that have only been surpassed at specific offset frequencies by dedicated research systems developed in leading national metrology laboratories. Learn in our white paper how the combined phase noise performance and stability of X-MMS set a new practical reference in the X-band domain: 🔗 https://lnkd.in/dPigvyYd Interested in redefining your measurement floor? Let’s talk!