Post by piezosystem jena

NEW: High Accuracy Surface Inspection Application Note! 💡 During high-accuracy Z-scans on semiconductor wafers, standard focus drives can wobble or drift sideways. This lateral movement creates "ghost flaws"—microscopic image distortions that look exactly like real surface defects but are actually just machine errors. Our specialized MIPOS system solves this by tightening lateral runout down to 50 nm or less, delivering a 7-fold improvement in stability to ensure absolute measurement purity. Read the full application note on our website: https://lnkd.in/dr3M63WZ #applicationnote #semiconductor #MIPOS #accuracy #nanopositioning