Post by Park Systems

See us in action at #𝗦𝗘𝗠𝗜𝗖𝗢𝗡 𝗘𝗨𝗥𝗢𝗣𝗔 this week! Our team at Park Systems’ booth B1-913 is excited to discuss with you the latest #AFM and #Ellipsometry advancements for semiconductor and hard disk media, photomasks, MEMS and display device applications. Did you know that: 👉𝗥𝗲𝗳𝗲𝗿𝗲𝗻𝗰𝗲𝗱 𝘀𝗽𝗲𝗰𝘁𝗿𝗼𝘀𝗰𝗼𝗽𝗶𝗰 𝗲𝗹𝗹𝗶𝗽𝘀𝗼𝗺𝗲𝘁𝗿𝘆 enables fast, highly sensitive mapping of ultrathin film properties, making it essential for accurate semiconductor quality control. 👉𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀’ 𝗡𝗫-𝗪𝗮𝗳𝗲𝗿 enables fully automated, in-line atomic force microscopy with sub-angstrom height accuracy and automated defect review, delivering unparalleled wafer-inspection precision and throughput for semiconductor manufacturing. 𝗦𝘁𝗲𝗽 𝗯𝘆 𝗼𝘂𝗿 𝗯𝗼𝗼𝘁𝗵 𝘁𝗼 𝗹𝗲𝗮𝗿𝗻 𝗺𝗼𝗿𝗲! Or visit our website to discover 𝗮𝘂𝘁𝗼𝗺𝗮𝘁𝗲𝗱 𝘀𝗼𝗹𝘂𝘁𝗶𝗼𝗻𝘀 𝗳𝗿𝗼𝗺 𝗣𝗮𝗿𝗸 𝗦𝘆𝘀𝘁𝗲𝗺𝘀 𝗳𝗼𝗿 𝗶𝗻𝗱𝘂𝘀𝘁𝗿𝗶𝗮𝗹 𝗮𝗽𝗽𝗹𝗶𝗰𝗮𝘁𝗶𝗼𝗻𝘀: https://okt.to/SOVg4o #Semiconductor #Metrology #AFM #WaferInspection #QualityControl #Automation SEMI Europe