Post by Park Systems
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๐ฆ๐ฒ๐น๐ณ-๐ฑ๐ฟ๐ถ๐๐ถ๐ป๐ด ๐๐๐ ๐ต๐ฎ๐ ๐ป๐ผ๐ ๐ฎ๐ฟ๐ฟ๐ถ๐๐ฒ๐ฑ! In this paper, a team from School of Advanced Materials Science and Engineering of Sungkyunkwan University (SKKU) and Park Systems describe an AI-driven protocol that enables Park FX40 AFM to automatically hunt for features within a 50 micron field-of-view scan and then automatically acquire smaller field-of-view images. By supplementing this functionality with automated flattening recipes and Kelvin probe force microscopy measurements, researchers were able to systematically explore how the work function of flakes of Molybdenum Tungsten Ditelluride alloy (MoWTe2) depends on flake thickness. Since Park FX series AFMs require no manual hardware reconfiguration to measure multiple samples in several complementary modes with the optimal probe, self-driving functionality enables new kinds of correlative experiments to be performed! ๐๐๐ถ๐ป๐ธ ๐๐ผ ๐๐ต๐ฒ ๐ณ๐๐น๐น ๐ฝ๐ฎ๐ฝ๐ฒ๐ฟ ๐ถ๐ป ๐๐ต๐ฒ ๐ฐ๐ผ๐บ๐บ๐ฒ๐ป๐๐ Video caption: full video to be found it the supporting information of the paper #AFM #nanotechnology #AFMautomation #2Dmaterials #ParkSystems
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