Post by Park Systems

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๐—ฆ๐—ฒ๐—น๐—ณ-๐—ฑ๐—ฟ๐—ถ๐˜ƒ๐—ถ๐—ป๐—ด ๐—”๐—™๐—  ๐—ต๐—ฎ๐˜€ ๐—ป๐—ผ๐˜„ ๐—ฎ๐—ฟ๐—ฟ๐—ถ๐˜ƒ๐—ฒ๐—ฑ! In this paper, a team from School of Advanced Materials Science and Engineering of Sungkyunkwan University (SKKU) and Park Systems describe an AI-driven protocol that enables Park FX40 AFM to automatically hunt for features within a 50 micron field-of-view scan and then automatically acquire smaller field-of-view images. By supplementing this functionality with automated flattening recipes and Kelvin probe force microscopy measurements, researchers were able to systematically explore how the work function of flakes of Molybdenum Tungsten Ditelluride alloy (MoWTe2) depends on flake thickness. Since Park FX series AFMs require no manual hardware reconfiguration to measure multiple samples in several complementary modes with the optimal probe, self-driving functionality enables new kinds of correlative experiments to be performed! ๐Ÿ”—๐—Ÿ๐—ถ๐—ป๐—ธ ๐˜๐—ผ ๐˜๐—ต๐—ฒ ๐—ณ๐˜‚๐—น๐—น ๐—ฝ๐—ฎ๐—ฝ๐—ฒ๐—ฟ ๐—ถ๐—ป ๐˜๐—ต๐—ฒ ๐—ฐ๐—ผ๐—บ๐—บ๐—ฒ๐—ป๐˜๐˜€ Video caption: full video to be found it the supporting information of the paper #AFM #nanotechnology #AFMautomation #2Dmaterials #ParkSystems

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