Post by Hitachi High-Tech Europe

In this edition, you'll see how hybrid automation is reshaping electron microscopy for high-throughput labs, and how the SU3800/SU3900 platform brings SEM and BF-STEM imaging together for nanomaterials analysis. You'll also find practical guidance on choosing the right electron source for your SEM. Finally, find out where to meet us this summer, including IMC21 and the Battery Expo & Advanced Materials Show.