Post by Detection Technology

As inspection requirements continue to grow in industrial and defense applications, manufacturers need solutions that combine high image quality, speed, and efficiency. Detection Technology addresses these challenges with its proven and expanded X-Panel XL series of extra-large X-ray flat panel detectors. The benefits of large-area detector technology are demonstrated in collaboration with Fraunhofer IIS. Their innovative PolyCT technology enables the simultaneous scanning of multiple objects, while Detection Technology’s X-Panel 43108a provides the large imaging area required for efficient multi-object CT acquisition. Developed jointly by Fraunhofer IIS and X-rayLab GmbH, PolyCT significantly increases industrial CT throughput. In the demonstrated setup, up to five 28 mm turbine blade test objects can be scanned simultaneously at 23 μm resolution, delivering excellent image quality in minimal time. This week at ECNDT 2026 in Verona, Italy, we are showcasing both the X-Panel XL series and the PolyCT system concept. Visit us at stand 140–141 to learn how advanced imaging technologies can increase inspection efficiency and throughput. Video courtesy of X-rayLab GmbH and Fraunhofer IIS. #ECNDT2026 #NDT #ComputedTomography #IndustrialCT #XrayImaging #QualityAssurance #DefenseIndustry #InspectionTechnology #DetectionTechnology #FraunhoferIIS #PolyCT

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