Post by Bruker Nano Surfaces & Metrology

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๐Ÿ“– ๐——๐—ถ๐—ฑ ๐˜†๐—ผ๐˜‚ ๐—ธ๐—ป๐—ผ๐˜„ ๐˜๐—ต๐—ฎ๐˜ ๐—ผ๐˜‚๐—ฟ ๐—ฎ๐—ฝ๐—ฝ๐—น๐—ถ๐—ฐ๐—ฎ๐˜๐—ถ๐—ผ๐—ป ๐—ฎ๐—ป๐—ฑ ๐˜๐—ฒ๐—ฐ๐—ต๐—ป๐—ถ๐—ฐ๐—ฎ๐—น ๐—ป๐—ผ๐˜๐—ฒ๐˜€ ๐—ฎ๐—ฟ๐—ฒ ๐—ฎ๐˜ƒ๐—ฎ๐—ถ๐—น๐—ฎ๐—ฏ๐—น๐—ฒ ๐—ถ๐—ป ๐—ณ๐˜‚๐—น๐—น ๐—ผ๐—ป ๐—ผ๐˜‚๐—ฟ ๐˜„๐—ฒ๐—ฏ๐˜€๐—ถ๐˜๐—ฒ? This is our latest Technical Note, "Automated Measurement Recipes for Photothermal AFMโ€‘IR". โ–ถ๏ธ https://lnkd.in/g8Rx9yXB It describes the workflows and recipe process, then presents case studies demonstrating AutoMETโ€™s utility for defect review and multiโ€‘sample analysis, using the Dimension IconIR and IconIR300 systems. ย  #spectroscopy #AFM #software

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