United States
Extensive knowledge in material science and solid state physics, with an emphasis in advanced characterization using (scanning) transmission electron microscopy. Experience in aberration-corrected machines, both probe and image corrected for imaging and spectroscopy. I have implemented different methodologies of recent developments in the electron microscopy field, such as differential phase contrast for imaging electric fields and multivariate analysis in EELS for phase identification. Development of multifunctional nanomaterials produced by physical vapor deposition methods with emphasis on synthesis and advance characterization, including: Crystallinity by X-Ray diffraction (XRD) and transmission electron microscopy ((S)TEM), morphology by scanning electron microscopy (SEM) and transmission electron microscopy, composition by spectroscopy techniques EDS, XPS, GD-OES and EELS.
Advanced Electron Microscopy Imaging and Spectroscopy