Antwerp Metropolitan Area
Piet De Moor joined imec in 1998 after obtaining his PhD degree in Physics from Leuven University. First he was involved in research and development of MEMS based infrared detector systems and MEMS packaging at wafer level. Later on he was leading a team developing 3D integration technology, including wafer thinning, through-Si via processing and high density bumping. His current research focus is advanced CMOS imagers such as backside illuminated and hybrid imagers suitable for high-end imaging applications.
Responsible for funded proposals regarding e.g. space, imaging, GaN, ...