Olaf Thamm

Test Engineer at Texas Instruments

Greater Munich Metropolitan Area

About

Several years experience in test development (ATE) and sustaining of test solutions for volume production of RFID LF circuits for automotive (Remote Keyless Entry, Immobilizer, Passive Entry/Passive Start). Responsible for several device families for automotive and industrial customers Specialties Automated Test Equipment(ATE), Device Qualification, High Volume Production support, Test Optimization, Device Characterization

Experience

  • Texas Instruments (Freising)
    • Test and Product Engineer
      Jan 2006 - Present · 20 yrs 6 mos

      Sustaining of test solutions for volume production Qualification, Characterization, Ramp to Production, Test Optimization (HW/SW), Production support

    • Test Engineer
      Jan 2001 - Dec 2005 · 5 yrs

      test development (ATE) HW and SW for automotive devices Qualification, Characterization, Ramp to Production

  • Electrical Engineer at Draexlmaier Systemtechnik GmbH, Draexlmaier Group
    May 1997 - Dec 2000 · 3 yrs 8 mos

    Responsible for company standardization

  • Electrical Engineer at VOLKE Consulting Engineers GmbH & Co. Planungs KG
    Jul 1995 - Apr 1997 · 1 yr 10 mos

    HW-SW Development of operation concept for automotive customer

  • Master Thesis at Siemens
    Oct 1994 - Mar 1995 · 6 mos

    Development of VHDL-code for display controller with simulation and documentation