Germany
Metrology, Optics, Solid State Physics, Nanomaterials, Light Scattering, Spectrometry, Colour, Integrated Optics, Marketing, Technical Sales, Product Management, Project Management Specialties: Qualification as professor, Reviewer for international renowned professional journals (e.g. Applied Optics, JOSA, JSQRT, Applied Physics A, B), Author of seven scientific books
Multi Purpose Software - Data processing and manipulation of 2D- and 3D-data - Digitalisation of data from bitmaps Optics Software - Reflectance and transmittance and ellipsometric parameters of a planar multilayer system - Analysis of layer thickness of multilayer systems - Optical Constants - Colour values from measured and calculated spectra Spectrometer Software - Measurement of reflectance and transmittance of thin films - Simulation and analysis of multilayer stacks Light scattering by particles - Light scattering and absorption by spherical particles - Light scattering and absorption in the near field of a sphere - Light scattering and absorption of a sphere on or near a surface - Light scattering and absorption by infinitely long cylinders - Light scattering and absorption by small particles in the Rayleigh limit - Light scattering and absorption by aggregates of spherical particles - Light scattering and absorption by irregularly shaped particles with the Discrete Dipole Approximation - Small Angle Scattering
Development of new optical sensors, Supervision of funded projects
Coordination of Sales and Production
Colour Measurement, Thin Film Thickness, Simulation
Development of spectrometers for UV-range and the characterisation of blue-ray discs
Development of integrated optics elements for the telecommunication in the CWDM sector
Micro Resonators, Raman Spectroscopy, X-ray Small Angle Scattering, Optical Nearfield, linear and nonlinear optical properties of Nanoparticles, Quantum Dots and Quantum Wires, Light Scattering, Aerosol Metrology, Photoelectron Spectroscopy, Electron Microscopy, Solid State Physics