Hsinchu City, Taiwan, Taiwan
2022.6~ Developing automated data analysis programs to shorten 30% of the staff's working time and ensuring the accuracy of analysis results for manager team to make the decision or policy. Strengthening the company's quality management and improving customer satisfaction (real-time monitoring system for production line operation). 2021.5~2022.6 In charge of development of CIS inspection machine(C340HX), including the algorithm to recognize defects from different Package layers( glass top/bottom, die), die-bonding/wire-bonding defect, substrate/BGA/Epoxy/glue/compound defect, package side inspection and illumination method. Cooperating with KOR R&D, designed team and end user. To solve end user application issues with Intekplus machines. To collect end user feedback to further improve Intekplus machine software and mechanism. 2013.2~2021.5 8 years experience doing AOI software development in CIS package for automative industry, using visual studio C/C#/C++, dothinkey, devwareX, simian, Hyvision SDK. Recently I have completed two AOI projects. One is FVI(HT-1603), flying test designed, multiple-angles light source, achieve 3um/pixel in resolution.The other is PLAI(HT1610), auto focusing, 2D Reader, real-time particle monitor, inking tools.
CIS Imaging test development, Automated system development and Data Analysis, dashboard, DB, AOI technology consultant, semi auto AOI platform dev, AOI to micro scope defects coordination switching. Halcon 13/18, Cognex AI, Onsemi Devware, YoLo, ARM Cortex-M
As the role of Intekplus team Taiwan branch, maintain the machine and participate in CIS AOI machine development.
2018-2021 Developing FVI and PLAI AOI software to detect sensor and non sensor area defect, including particle, scratch, contamination, die chipping/crack, back side substrate inking, OCR, ball, especially to recognize which layer the defect belongs to (glass top, bottom or die layer). Familiar with lighting technics, optical system selection. 2013-2017 Developing software, Windows, to detect image dead、wounded、hot pixel、cluster、blemish、dead-line、white balance、 dark corner、uniformity、color ratio phenomenon at yuv、low、middle、dark mode. chroma DC program maintain.