South Korea
Semiconductor professional with over 10 years of experience in ATE test development for PMIC, CIS, and SoC products, currently working as a Senior Product Development Engineer at NVIDIA. Skilled in developing ATE test programs, improving test stability, and enhancing production readiness for high-performance semiconductor products. Focused on driving reliable execution in high-volume manufacturing environments. Proficient in C++/C#, VBA, and Java, with hands-on expertise in Teradyne and Advantest platforms. Committed to optimizing test flows and ensuring seamless transitions from validation to mass production.
• Developed ATE test programs for high-performance semiconductor products, ensuring production readiness. • Focused on high-power and multi-domain conditions to enhance product reliability. • Improved test stability through innovative current profiling and stress-aware test flows.
• Led test development for Teradyne IFLEX and Advantest T2000, focusing on automotive PMIC products. • Enhanced reliability and robustness to meet stringent automotive qualification requirements. • Facilitated the transition from validation to stable production use, ensuring smooth operational flow.
• Developed ATE test hardware and test programs for Mobile PMIC devices on Teradyne ETS364 and Advantest T2000. • Implemented optimized trimming and calibration flows to enhance production efficiency. • Ensured a smooth transition to mass production, maintaining stable operations.
• ATE test development for CMOS Image Sensor products on Advantest T2000, ensuring high-quality testing standards. • Implemented the first indirect ToF 16-sites parallel test with a single light source, enhancing production throughput. • Focused on improving test scalability, contributing to more efficient production processes at SK hynix.
• Supported customers with ATE setup and test program debugging on Teradyne UltraFlex. • Delivered fundamental programming training on UltraFlex to customer engineers.