Penang, Malaysia
1. Debugged wafer sort and probe test issues using structured methodologies, isolating hardware, wafer, and test program-related root causes. 2. Troubleshot high bin failures and abnormal test behavior to minimize downtime and ensure test continuity in production. 3. Analyzed wafer sort to identify yield loss, process drift, and systematic failure patterns. 4. Improved probe test programs to enhance robustness, reduce false failures, and maintain electrical compliance for stable production yield. 5. Led yield improvement initiatives across ADBMS products, achieving an average 6% yield gain and enhancing overall production performance.
1. Managed large-scale data extraction and transformation using Intel proprietary tools, ensuring data integrity across fabrication operations. 2. Performed yield analysis using JMP, applying statistical methods and distribution fitting to identify and reduce yield loss. 3. Developed JMP scripts and automated data processes to improve efficiency and minimize manual effort. 4. Built advanced Excel reports (pivot tables, VBA, formulas) to enable fast, data-driven yield insights and decision-making. 5. Collaborated cross-functionally, applying DOE and Pareto analysis to resolve yield issues and deliver actionable insights.
1. Transformed and standardized large datasets from CSV and SharePoint sources using Power Query in Power BI, ensuring data consistency for analysis and future ML use. 2. Developed interactive Power BI dashboards with automated refreshes, providing real-time insights on machine availability and yield performance. 3. Enhanced dashboards using DAX, drill-throughs, slicers, and conditional formatting to support dynamic reporting needs. 4. Built a Power App to streamline tool transaction tracking, improving inventory control and reducing manual errors. 5. Automated workflows with Power Automate for data refresh and notifications, improving efficiency and reporting timeliness.