James Deng

Micron NAND & AI Leader | From Flash to Intelligence – Building the Future of Memory

United States

About

Proven engineering leader with deep expertise in silicon validation, test infrastructure, and AI-driven product engineering, with a track record of building and leading global teams to deliver high-impact results across emerging silicon technologies. Strong technical depth, cross-functional leadership, and collaborating directly with top-tier customers to accelerate validation cycles and enable silicon success at scale.

Experience

  • Micron Technology ()
    • Director, NAND Validation and Characterization
      Oct 2021 - Apr 2025 · 3 yrs 7 mos

      Led global NAND validation and characterization team working with design teams to define test coverage and methodology for all Micron NAND from gen7 to gen9 covering functional validation, datasheet characterization, power and speed characterization.

    • Director, NAND Solutions Product Engineering
      Dec 2018 - Oct 2021 · 2 yrs 11 mos

      Formed a team and brought up a brand new test infrastructure for validation, characterization and qualification of a custom mobile NAND product for the largest US smart phone maker. Executed a successful qualification within the first year to enable customer shipment and revenue generation.

  • Western Digital (1 yr 7 mos)
    • Director, Client SSD Product Engineering
      Jun 2018 - Dec 2018 · 7 mos

      Brought up a new test infrastructure and developed characterization test flow for a new custom mobile NAND product used by the largest US smart phone maker. Worked directly with the customer to debug failures and provide corrective actions.

    • Director, NAND Characterization and Failure Analysis
      Jun 2017 - Jun 2018 · 1 yr 1 mo

      Brought up a new test infrastructure and developed characterization test flow for a new custom mobile NAND product used by the largest US smart phone maker. Worked directly with the customer to debug failures and provide corrective actions.

  • Sandisk (7 yrs 1 mo)
    • Senior Manager, NAND Characterization and Failure Analysis
      2015 - 2017 · 2 yrs

    • Manager II, Characterization Engineer
      2012 - 2015 · 3 yrs

    • Staff Characterization Engineer
      2010 - 2012 · 2 yrs

  • Test/Product Engineer Lead at Kovio
    2006 - 2010 · 4 yrs

    Test and product lead who developed, from the ground up, test infrastructure and programs for testing printed silicon technology for RFID products on next-generation ATE tester