Dario Alliata

HEAD of M&I Applications & Product Management

Grenoble, Auvergne-Rhône-Alpes, France

About

Focus on development & adoption of Process Control solution for Semiconductor Industry since 2001. Specialist of Advanced Packaging (FOWLP/FIWLP, 3D/2.5D, COWOS, SIP) Liason with International Branch offices. Coordinator of Joint Development Projects in collaboration with either production facilities or R&D centers and responsible for Tier1 customers. Managing team of 30 application engineers world-wide located. Responsible for P&L & Product Roadmaps Conference Speaker with 40+ scientific/technical papers & articled published Specialties: -Market Analysis -Customer Analysis & Strategic Selling -Project management with multi-disciplinary competences -Strong relationships with final customers -Good knowledge of industry sales processes -Excellent technical and analytical skills -Ability to breakdown complex topics into feasible work packages -Proven oral and written communication skills -Product Management (PLC, P&L) -Technical liaison; Process Knowhow: -Semiconductors--> FEOL/BEOL, Backend (EWS, Bumping, Probing, Dicing, Bonding), Advanced packaging (FOWLP/FIWLP, 2.5D & 3D-IC) -Energy--> Li-ion batteries, Supercapacitors based on carbon materials -Biophysics/nanotechnologies--> Metallo-proteins, redox-centers, single-tunneling junctions, bio-sensors, Langmuir-Blodgett thin film deposition Technical skills: -Metal deposition (PVD, CVD, ALD, ECD) -Metrology Characterisation: Pump/Probe opto/acoustic techniques, Ellipsometry, Refractometry, Laser triangulation, Interferometry (White-light and IR), Confocal Microscopy, Scanning Probe Microcsopy (AFM, Conductive-AFM, LFM, STM); -Defect Inspection: Macro/Micro inspection based on Automatic Visual Detection in visible and infrared domain, Confocal Chromatic Microscopy, Phase Shift Deflectometry; sub-micron inspection based on light-scattering; -Data Analysis solutions: Yield management systems and Automatic Data Classification. -Electrochemistry: Cyclic Voltammetry, Impedance Spectroscopy

Experience

  • Merck Electronics (Permanent · 3 yrs 2 mos)
    • HEAD of M&I Applications & Product management
      Sep 2025 - Present · 10 mos

    • Sr. Director of Applications
      May 2023 - Present · 3 yrs 2 mos

      Following the acquisition of UnitySC, I am continuing my current responsibilities as part of the Electronics business of Merck within the Metrology & Inspection division

  • UnitySC (9 yrs 9 mos)
    • Director of Applications
      May 2020 - Present · 6 yrs 2 mos

      identification of customer need & corresponding solution in Unitysc products; responsible of customers worldwide applications support, demo and tool qualification services. Focus on value selling and strategic applications development & adoption

    • Director of Business Unit
      Mar 2018 - May 2020 · 2 yrs 3 mos

      Business Unit P&L Team building & management Product Life Cycle

    • Metrology Product manager
      Oct 2016 - Mar 2018 · 1 yr 6 mos

      Product Manager for process control solutions in Advance Packaging Area Managing R&D program funded by public institutions and Joint Development Program in collaborations with key R&D center/Consortium or customers

  • Senior Applications Scientist at Rudolph Technologies
    Apr 2004 - Sep 2016 · 12 yrs 6 mos

    Senior Applications Scientist working in Semiconductor Industry Main responsibilities & duties: -Joint Development Projects local coordinator & Technical liaison between company and industrial partners; -First contact point for major European customer; -Pre/Post sales applications support on Visual Inspection, data Analysis & Metrology product lines. Technical area of interest: -FSI & BSI image sensors, -2.5D silicon interposer, TSV & 3Di for Advanced Packaging technologies; -Blank Mask inspection for next generation lithography; -FrontEnd thickness characterization;

  • Researcher at INFM
    Apr 2002 - Apr 2004 · 2 yrs 1 mo

    Electron transfer reactions investigation by Conductive Scanning Force Microscopy, Electrochemical controlled Scanning Tunnelling Microscopy and Cyclic Voltammetry. Activity cofounded by SAMBA European project

  • Applications Scientist at Rudolph Technologies, Inc
    Jan 2001 - Mar 2002 · 1 yr 3 mos

    Expert in residence supporting STMicroelectronics customer on Metal characterization by opto/acoustic technique (MetaPULSE)