Charles C.

Director of YIDDMA at LTD (Yield, Integration, Device, Defect and Metrology Analytics )

Hillsboro, Oregon, United States

About

Experienced Executive / Senior Manager & Technical Leader who has led all phases of the Silicon Integrated Circuit manufacturing life cycle ( 0.8um - 1nm): technology feature definition, DR and PDK development, DTCO / DFM optimization, process-device development, product-process development, reliability improvement, yield-performance co-optimization, process-product-certification, volume yield ramp, fab process transfer and matching, Greenfield factory hiring, startup, high volume manufacturing ramp, and cost reduction, for 10+ generations of CPUs, SoCs integrated circuits and memory ( DRAM / NOR Flash ) products at best in class metrics.

Experience

  • Intel Corporation (Full-time · 2 yrs 4 mos)
    • Director
      Aug 2024 - Present · 1 yr 11 mos

      General Manager of YIDDMA responsible for Intel Logic Technology Development Yield, Sort/Test, MIE, Device, Defect, Metrology-FA/FI, External Engagements Analytics

    • Technical Assistant
      Mar 2024 - Aug 2024 · 6 mos

      Technical Assistant to the Corporate VP and Co-General Manager of Logic Technology Development

  • Technical Director of Operations at TSMC
    Nov 2020 - Dec 2023 · 3 yrs 2 mos

    Director for Fab21 E1 Division responsible for Integration, Device/WAT, Yield, Fab Customer Interface, YED ( Yield Excellence Department) - Fab Defect Metrology Departments for N4. The team supported HVM NTO, process improvement / development and manufacturing in Tainan F18 N5 and N4 for ~18 months.

  • Senior Director & Account Technologist at Applied Materials
    Jan 2019 - Oct 2020 · 1 yr 10 mos

    Lead integration technologist for internal roadmap tool feature definition, integrated process development, and customer demo for an advanced new cluster tool application enabling continued Moore’s Law scaling!

  • Engagement Director at PDF Solutions
    Sep 2016 - Dec 2019 · 3 yrs 4 mos

    Led a team of 14 consultants and analysts in driving a client's successful accelerated development of IP verification, DTCO, Process Yield & Performance for N and N+1 logic process

  • Intel Corporation (23 yrs 1 mo)
    • LTD SOC Program Manager and D1C Yield Department Manager
      2002 - 2016 · 14 yrs

      Led the development, process certification, yield ramp, and transfer of SoC derivative and logic shrink for 90nm, 65nm, 32nm, 22nm, 14nm process nodes, including 22FFL and 22nm eDRAM. Co-manager of the D1C Integration, Device, Yield, Product, Defect Metrology, FA, and Q&R departments.

    • Fab 22 Yield Department Manager
      1999 - 2002 · 3 yrs

      Led the Integration, Product, Device, Yield, Defect Metrology, Q&R, and Labs Departments in the mother fab seeding, transfer, ramp, and volume production of 130nm Logic and SoC products.

    • Fab 20 Integration Section Manager
      1998 - 1999 · 1 yr

      Led the FEOL Integration team in the ramp and manufacturing of 180nm Logic CPUs